New defect detection method using scattered radiation

M.K. Nguyen, T.T. Truong, J. Blanc-Talon, L. Pigois
Proc. 7th Int. Conf. Quality Control by Artificial Vision (QCAV) - May 2005

BibTex references

@InProceedings{NTBP05,
  author       = "Nguyen, M.K. and Truong, T.T. and Blanc-Talon, J. and Pigois, L.",
  title        = "New defect detection method using scattered radiation",
  booktitle    = "Proc. 7th Int. Conf. Quality Control by Artificial Vision (QCAV)",
  month        = "May",
  year         = "2005",
  address      = "Nagoya, Japan",
  url          = "http://publi-etis.ensea.fr/2005/NTBP05"
}

Other publications in the database

» M.K. Nguyen
» T.T. Truong
» J. Blanc-Talon
» L. Pigois