Spatially Constrained Independent Component Analysis Algorithm for Real-Time Artifact Removal from the Electroencephalogram

M. Devos, L. De Lathauwer, A. Vergult, W. De Clercq, W. Van Paesschen, S. Van Huffel
Proc. First Annual Symp. of IEEE/EMBS Benelux Chapter, page 159--163 - Dec. 7--8 2006

BibTex references

@InProceedings{DDVDVV06a,
  author       = "Devos, M. and De Lathauwer, L. and Vergult, A. and De Clercq, W. and Van Paesschen, W. and Van Huffel, S.",
  title        = "Spatially Constrained Independent Component Analysis Algorithm for Real-Time Artifact Removal from the Electroencephalogram",
  booktitle    = "Proc. First Annual Symp. of IEEE/EMBS Benelux Chapter",
  pages        = "159--163",
  month        = "Dec. 7--8",
  year         = "2006",
  address      = "Brussels, Belgium",
  url          = "http://publi-etis.ensea.fr/2006/DDVDVV06a"
}

Other publications in the database

» M. Devos
» L. De Lathauwer
» A. Vergult
» W. De Clercq
» W. Van Paesschen
» S. Van Huffel